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Conference Paper

Measurement of trace element diffusivities: comparison between SYXRF and SIMS

Authors

Tegge-Schüring,  A.
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Koepke,  J.
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Behrens,  H.
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Hahn,  M.
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Falkenberg,  G.
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Wiedenbeck,  Michael
4.2 Inorganic and Isotope Geochemistry, 4.0 Chemistry and Material Cycles, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

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Citation

Tegge-Schüring, A., Koepke, J., Behrens, H., Hahn, M., Falkenberg, G., Wiedenbeck, M. (2001): Measurement of trace element diffusivities: comparison between SYXRF and SIMS, DMG (Potsdam).


https://gfzpublic.gfz-potsdam.de/pubman/item/item_228811
Abstract
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