Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis 
(m-SRXRF) compared with secondary ion mass spectrometry

Hahn, M.; Tegge-Schüring, A.; Behrens, H.; Koepke, J.; Rickers, K.; Falkenberg, G.; Wiedenbeck, Michael; 3.3 Chemistry and Physics of Earth Materials, 3.0 Geodynamics and Geomaterials, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum

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Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis (m-SRXRF) compared with secondary ion mass spectrometry

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Hahn, M.
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Tegge-Schüring, A.
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Behrens, H.
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Koepke, J.
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Rickers, K.
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Falkenberg, G.
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Wiedenbeck, Michael
4.2 Inorganic and Isotope Geochemistry, 4.0 Chemistry and Material Cycles, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

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Hahn, M., Tegge-Schüring, A., Behrens, H., Koepke, J., Rickers, K., Falkenberg, G., Wiedenbeck, M. (2003): Beamline L: White beam synchrotron radiation X-ray fluorescence microanalysis (m-SRXRF) compared with secondary ion mass spectrometry. - In: Hasylab Annual Report 2003, HASYLAB, 1093-1094.

https://gfzpublic.gfz-potsdam.de/pubman/item/item_231812

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