Trace element diffusion in rhyolitic melts: Comparison between synchrotron 
radiation X-ray fluorescence microanalysis (µ-SRXRF) and secondary ion mass 
spectrometry (SIMS)

Hahn, M.; Behrens, H.; Tegge-Schüring, A.; Koepke, J.; Horn, I.; Rickers, K.; Falkenberg, G.; Wiedenbeck, Michael; 3.3 Chemistry and Physics of Earth Materials, 3.0 Geodynamics and Geomaterials, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum

doi:10.1127/0935-1221/2005/0017-0233

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Trace element diffusion in rhyolitic melts: Comparison between synchrotron radiation X-ray fluorescence microanalysis (µ-SRXRF) and secondary ion mass spectrometry (SIMS)

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Hahn, M.
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Behrens, H.
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Tegge-Schüring, A.
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Koepke, J.
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Horn, I.
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Rickers, K.
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Falkenberg, G.
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Wiedenbeck, Michael
4.2 Inorganic and Isotope Geochemistry, 4.0 Chemistry and Material Cycles, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

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Hahn, M., Behrens, H., Tegge-Schüring, A., Koepke, J., Horn, I., Rickers, K., Falkenberg, G., Wiedenbeck, M. (2005): Trace element diffusion in rhyolitic melts: Comparison between synchrotron radiation X-ray fluorescence microanalysis (µ-SRXRF) and secondary ion mass spectrometry (SIMS). - European Journal of Mineralogy, 17, 2, 233-242.
https://doi.org/10.1127/0935-1221/2005/0017-0233

https://gfzpublic.gfz-potsdam.de/pubman/item/item_233155

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