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Focused Ion Beam (FIB): site-specific sample preparation, nano-analysis, nano-characterization and nano-machining

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Wirth,  Richard
3.3 Chemistry and Physics of Earth Materials, 3.0 Geodynamics and Geomaterials, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

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Wirth, R. (2010): Focused Ion Beam (FIB): site-specific sample preparation, nano-analysis, nano-characterization and nano-machining. - In: Brenker, F. E., Jordan, G. (Eds.), Nanoscopic approaches in Earth and planetary sciences, (EMU Notes in Mineralogy; 8).


https://gfzpublic.gfz-potsdam.de/pubman/item/item_243099
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