English
 
Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Conference Paper

Characterizing Primary Ion Components within the Secondary Ion Beam

Authors
/persons/resource/michawi

Wiedenbeck,  Michael
4.2 Inorganic and Isotope Geochemistry, 4.0 Chemistry and Material Cycles, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

/persons/resource/rhede

Rhede,  Dieter
4.2 Inorganic and Isotope Geochemistry, 4.0 Chemistry and Material Cycles, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

External Ressource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in GFZpublic
Supplementary Material (public)
There is no public supplementary material available
Citation

Wiedenbeck, M., Rhede, D. (1999): Characterizing Primary Ion Components within the Secondary Ion Beam, SIMS 12 Conference (Brussels, Belgium).


https://gfzpublic.gfz-potsdam.de/pubman/item/item_248092
Abstract
There is no abstract available