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  Focused Ion Beam (FIB): site-specific sample preparation, nano-analysis, nano-characterization and nano-machining

Wirth, R. (2010): Focused Ion Beam (FIB): site-specific sample preparation, nano-analysis, nano-characterization and nano-machining. - In: Brenker, F. E., Jordan, G. (Eds.), Nanoscopic approaches in Earth and planetary sciences, (EMU Notes in Mineralogy; 8).

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Item Permalink: https://gfzpublic.gfz-potsdam.de/pubman/item/item_243099 Version Permalink: -
Genre: Book Chapter

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 Creators:
Wirth, Richard1, Author              
Affiliations:
13.3 Chemistry and Physics of Earth Materials, 3.0 Geodynamics and Geomaterials, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum, ou_146036              

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 DDC: 550 - Earth sciences
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 Dates: 2010
 Publication Status: Finally published
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 Identifiers: eDoc: 16637
GFZPOF: PT2 Earth System Dynamics: Coupled Processes and Regional Impact
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Title: Nanoscopic approaches in Earth and planetary sciences
Source Genre: Book
 Creator(s):
Brenker, F. E.1, Editor
Jordan, G.1, Editor
Affiliations:
1 External Organizations, ou_persistent22            
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -

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Title: EMU Notes in Mineralogy ; 8
Source Genre: Series
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