Source Location by Diffraction Stacking

Gajewski, D. J.; Anikiev, D.; Kashtan, B.; Tessmer, E.; Vanelle, C.

doi:10.3997/2214-4609.201401879

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Source Location by Diffraction Stacking

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Gajewski, D. J.
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Anikiev, D.
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Kashtan, B.
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Tessmer, E.
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Vanelle, C.
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Gajewski, D. J., Anikiev, D., Kashtan, B., Tessmer, E., Vanelle, C. (2007): Source Location by Diffraction Stacking - Conference Proceedings, 69th EAGE Conference and Exhibition incorporating SPE EUROPEC 2007 (London, UK 2007).
https://doi.org/10.3997/2214-4609.201401879

Cite as: https://gfzpublic.gfz-potsdam.de/pubman/item/item_5012735

Abstract

P215 Source Location by Diffraction Stacking D.J. Gajewski* (University of Hamburg) D. Anikiev (St. Petersburg State University) B. Kashtan (St. Petersburg State University) E. Tessmer (University of Hamburg) & C. Vanelle (University of Hamburg) SUMMARY For deposits with weak 4-D signatures the passive seismic method may provide an alternative option for reservoir characterization. We introduce a new localization technique which does not require any picking of events in the individual seismograms of the recording network. The localization is performed by a modified diffraction stack of the squared amplitudes of the input seismograms resulting in the image section.