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A novel method for analogue modelling of lithospheric-scale rifting, monitored through X-Ray CT-scanning, at the University of Bern Tectonic Modelling Laboratory (Switzerland)

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Zwaan,  Frank
2.5 Geodynamic Modelling, 2.0 Geophysics, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

Schreurs,  Guido
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Citation

Zwaan, F., Schreurs, G. (2023): A novel method for analogue modelling of lithospheric-scale rifting, monitored through X-Ray CT-scanning, at the University of Bern Tectonic Modelling Laboratory (Switzerland).
https://doi.org/http://doi.org/10.5880/fidgeo.2023.005


Cite as: https://gfzpublic.gfz-potsdam.de/pubman/item/item_5015580
Abstract
This data set is a description of a novel analogue modelling method used to run lithospheric-scale tectonic models, and to uniquely monitor these models through X-Ray CT-scanning techniques at the Tectonic Modelling Lab of the University of Bern (Switzerland). It includes information on the model set-up and model materials, and includes a step-by-step description of the general modelling procedure. A first application of this novel procedure, for the simulation of lithospheric scale rifting processes can be found in Zwaan & Schreurs (2023a) in Tectonics, with supplementary data publicly available via GFZ Data Services (Zwaan & Schreurs 2023b). The results of this work prove the feasibility of the method, and opens the door to a broad variety of new tectonic modelling studies