date: 2022-02-18T13:00:22Z pdf:PDFVersion: 1.6 pdf:docinfo:title: Electronic, Structural, and Mechanical Properties of SiO2 Glass at High Pressure Inferred from its Refractive Index xmp:CreatorTool: © 2022 American Physical Society access_permission:can_print_degraded: true subject: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 dc:format: application/pdf; version=1.6 pdf:docinfo:creator_tool: © 2022 American Physical Society access_permission:fill_in_form: true pdf:encrypted: false dc:title: Electronic, Structural, and Mechanical Properties of SiO2 Glass at High Pressure Inferred from its Refractive Index modified: 2022-02-18T13:00:22Z cp:subject: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 pdf:docinfo:custom:CrossMarkDomains[1]: journals.aps.org pdf:docinfo:subject: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 DOI: 10.1103/PhysRevLett.128.077403 pdf:docinfo:creator: Sergey S. Lobanov meta:author: Sergio Speziale meta:creation-date: 2022-02-17T00:00:00Z pdf:docinfo:custom:CrossmarkMajorVersionDate: 2022-02-17 created: Thu Feb 17 01:00:00 CET 2022 access_permission:extract_for_accessibility: true Creation-Date: 2022-02-17T00:00:00Z pdf:docinfo:custom:CrossmarkDomainExclusive: false Author: Sergio Speziale producer: Acrobat Distiller 10.1.16 (Windows) CrossmarkDomainExclusive: false pdf:docinfo:producer: Acrobat Distiller 10.1.16 (Windows) dc:description: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 Keywords: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 access_permission:modify_annotations: true dc:creator: Sergio Speziale description: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 dcterms:created: 2022-02-17T00:00:00Z Last-Modified: 2022-02-18T13:00:22Z dcterms:modified: 2022-02-18T13:00:22Z title: Electronic, Structural, and Mechanical Properties of SiO2 Glass at High Pressure Inferred from its Refractive Index xmpMM:DocumentID: uuid:6e42f5c9-a33e-4d13-8e7d-e15c72898748 Last-Save-Date: 2022-02-18T13:00:22Z CrossMarkDomains[1]: journals.aps.org pdf:docinfo:keywords: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 pdf:docinfo:modified: 2022-02-18T13:00:22Z meta:save-date: 2022-02-18T13:00:22Z pdf:docinfo:custom:DOI: 10.1103/PhysRevLett.128.077403 Content-Type: application/pdf X-Parsed-By: org.apache.tika.parser.DefaultParser creator: Sergio Speziale dc:subject: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 access_permission:assemble_document: true xmpTPg:NPages: 8 access_permission:extract_content: true access_permission:can_print: true meta:keyword: doi:10.1103/PhysRevLett.128.077403 url:https://doi.org/10.1103/PhysRevLett.128.077403 access_permission:can_modify: true pdf:docinfo:created: 2022-02-17T00:00:00Z CrossmarkMajorVersionDate: 2022-02-17