English
 
Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  High resolution temperature and spectral emissivity mapping (HiTeSEM)

Udelhoven, T., Bossung, C., Rock, G., Fischer, P., Müller, A., Storch, T., Segl, K., Eisele, A., Schlerf, M., Knigge, T. (2016): High resolution temperature and spectral emissivity mapping (HiTeSEM). - In: 2016 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 10-15, 2016, Beijing, China, Piscataway, NJ  : IEEE, 272-275.
https://doi.org/10.1109/IGARSS.2016.7729062

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Udelhoven, T.1, Author
Bossung, C.1, Author
Rock, G.1, Author
Fischer, P.1, Author
Müller, A.1, Author
Storch, T.1, Author
Segl, K.2, Author              
Eisele, A.2, Author              
Schlerf, M.1, Author
Knigge, T.1, Author
Affiliations:
1External Organizations, ou_persistent22              
21.4 Remote Sensing, 1.0 Geodesy, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum, ou_146028              

Content

show

Details

show
hide
Language(s):
 Dates: 2016
 Publication Status: Finally published
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: GFZPOF: p3 PT1 Global Processes
DOI: 10.1109/IGARSS.2016.7729062
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: 2016 IEEE International Geoscience & Remote Sensing Symposium : proceedings : July 10-15, 2016, Beijing, China
Source Genre: Book
 Creator(s):
Affiliations:
Publ. Info: Piscataway, NJ : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 272 - 275 Identifier: -