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High resolution temperature and spectral emissivity mapping (HiTeSEM)

Authors

Udelhoven,  T.
External Organizations;

Bossung,  C.
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Rock,  G.
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Fischer,  P.
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Müller,  A.
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Storch,  T.
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/persons/resource/segl

Segl,  K.
1.4 Remote Sensing, 1.0 Geodesy, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

/persons/resource/eisele

Eisele,  A.
1.4 Remote Sensing, 1.0 Geodesy, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

Schlerf,  M.
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Knigge,  T.
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Citation

Udelhoven, T., Bossung, C., Rock, G., Fischer, P., Müller, A., Storch, T., Segl, K., Eisele, A., Schlerf, M., Knigge, T. (2016): High resolution temperature and spectral emissivity mapping (HiTeSEM). - In: 2016 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 10-15, 2016, Beijing, China, Piscataway, NJ  : IEEE, 272-275.
https://doi.org/10.1109/IGARSS.2016.7729062


Cite as: https://gfzpublic.gfz-potsdam.de/pubman/item/item_2426889
Abstract
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