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  High resolution temperature and spectral emissivity mapping (HiTeSEM)

Udelhoven, T., Bossung, C., Rock, G., Fischer, P., Müller, A., Storch, T., Segl, K., Eisele, A., Schlerf, M., Knigge, T. (2016): High resolution temperature and spectral emissivity mapping (HiTeSEM). - In: 2016 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 10-15, 2016, Beijing, China, Piscataway, NJ  : IEEE, 272-275.
https://doi.org/10.1109/IGARSS.2016.7729062

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Item Permalink: https://gfzpublic.gfz-potsdam.de/pubman/item/item_2426889 Version Permalink: https://gfzpublic.gfz-potsdam.de/pubman/item/item_2426889_2
Genre: Book Chapter

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 Creators:
Udelhoven, T.1, Author
Bossung, C.1, Author
Rock, G.1, Author
Fischer, P.1, Author
Müller, A.1, Author
Storch, T.1, Author
Segl, K.2, Author              
Eisele, A.2, Author              
Schlerf, M.1, Author
Knigge, T.1, Author
Affiliations:
1External Organizations, ou_persistent22              
21.4 Remote Sensing, 1.0 Geodesy, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum, ou_146028              

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 Dates: 2016
 Publication Status: Finally published
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: GFZPOF: p3 PT1 Global Processes
DOI: 10.1109/IGARSS.2016.7729062
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Title: 2016 IEEE International Geoscience & Remote Sensing Symposium : proceedings : July 10-15, 2016, Beijing, China
Source Genre: Book
 Creator(s):
Affiliations:
Publ. Info: Piscataway, NJ : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 272 - 275 Identifier: -