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  ‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry

Wu, H., Böttger, R., Couffignal, F., Gutzmer, J., Krause, J., Munnik, F., Renno, A. D., Hübner, R., Wiedenbeck, M., Ziegenrücker, R. (2019): ‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry. - Geostandards and Geoanalytical Research, 43, 4, 531-541.
https://doi.org/10.1111/ggr.12282

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Item Permalink: https://gfzpublic.gfz-potsdam.de/pubman/item/item_4522910 Version Permalink: https://gfzpublic.gfz-potsdam.de/pubman/item/item_4522910_5
Genre: Journal Article

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 Creators:
Wu, Haosheng1, Author
Böttger, Roman1, Author
Couffignal, F.2, Author              
Gutzmer, Jens1, Author
Krause, Joachim1, Author
Munnik, Frans1, Author
Renno, Axel D.1, Author
Hübner, René1, Author
Wiedenbeck, Michael2, Author              
Ziegenrücker, René1, Author
Affiliations:
1External Organizations, ou_persistent22              
23.1 Inorganic and Isotope Geochemistry, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum, ou_146040              

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Free keywords: ‘box‐profile’, multi‐energy ion implantation, electron probe microanalysis, secondary ion mass spectrometry, synthetic reference material
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 Dates: 2019
 Publication Status: Finally published
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 Rev. Type: -
 Identifiers: DOI: 10.1111/ggr.12282
URI: http://doi.crossref.org/servlet/query?format=unixref&pid=bib@gfz-potsdam.de&id=10.1111/ggr.12282
GFZPOF: p3 PT2 Plate Boundary Systems
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Title: Geostandards and Geoanalytical Research
Source Genre: Journal, SCI, Scopus
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Pages: - Volume / Issue: 43 (4) Sequence Number: - Start / End Page: 531 - 541 Identifier: CoNE: https://gfzpublic.gfz-potsdam.de/cone/journals/resource/journals187