‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron 
Probe Microanalysis and Secondary Ion Mass Spectrometry

Wu, Haosheng; Böttger, Roman; Couffignal, F.; Gutzmer, Jens; Krause, Joachim; Munnik, Frans; Renno, Axel D.; Hübner, René; Wiedenbeck, Michael; Ziegenrücker, René

doi:10.1111/ggr.12282

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‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry

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Wu, Haosheng
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Böttger, Roman
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Couffignal, F.
3.1 Inorganic and Isotope Geochemistry, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

Gutzmer, Jens
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Krause, Joachim
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Munnik, Frans
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Renno, Axel D.
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Hübner, René
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Wiedenbeck, Michael
3.1 Inorganic and Isotope Geochemistry, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

Ziegenrücker, René
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Citation

Wu, H., Böttger, R., Couffignal, F., Gutzmer, J., Krause, J., Munnik, F., Renno, A. D., Hübner, R., Wiedenbeck, M., Ziegenrücker, R. (2019): ‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry. - Geostandards and Geoanalytical Research, 43, 4, 531-541.
https://doi.org/10.1111/ggr.12282

Cite as: https://gfzpublic.gfz-potsdam.de/pubman/item/item_4522910

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