Electronic, Structural, and Mechanical Properties ofSiO2Glass at High Pressure 
Inferred from its Refractive Index

Lobanov, S. S.; Speziale, S.; Winkler, Björn; Milman, Victor; Refson, Keith; Schifferle, Lukas

doi:10.1103/PhysRevLett.128.077403

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Electronic, Structural, and Mechanical Properties ofSiO2Glass at High Pressure Inferred from its Refractive Index

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Lobanov, S. S.
3.6 Chemistry and Physics of Earth Materials, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

/persons/resource/speziale

Speziale, S.
3.6 Chemistry and Physics of Earth Materials, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

Winkler, Björn
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Milman, Victor
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Refson, Keith
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Schifferle, Lukas
3.6 Chemistry and Physics of Earth Materials, 3.0 Geochemistry, Departments, GFZ Publication Database, Deutsches GeoForschungsZentrum;

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Lobanov, S. S., Speziale, S., Winkler, B., Milman, V., Refson, K., Schifferle, L. (2022): Electronic, Structural, and Mechanical Properties ofSiO2Glass at High Pressure Inferred from its Refractive Index. - Physical Review Letters, 128, 077403.
https://doi.org/10.1103/PhysRevLett.128.077403

Cite as: https://gfzpublic.gfz-potsdam.de/pubman/item/item_5010072

Abstract

We report the first direct measurements of the refractive index of silica glass up to 145 GPa that allowed quantifying its density, bulk modulus, Lorenz-Lorentz polarizability, and band gap. These properties show two major anomalies at ∼10 and ∼40 GPa. The anomaly at ∼10 GPa signals the onset of the increase in Si coordination, and the anomaly at ∼40 GPa corresponds to a nearly complete vanishing of fourfold Si. More generally, we show that the compressibility and density of noncrystalline solids can be accurately measured in simple optical experiments up to at least 110 GPa.